Investigating Nanocrystalline Materials with Diffraction Line Profile Analysis
نویسندگان
چکیده
منابع مشابه
Stresses in nanocrystalline materials
Thin film Ni-Cu diffusion couples (individual layer thicknesses: 50 nm) were prepared by direct-current magnetron sputtering on silicon substrates. Interdiffusion and solid-solution formation, the associated changes of microstructure and the evolution of mechanical stresses of the Ni-Cu diffusion couples during thermal treatments were investigated employing ex-situ X-ray diffraction phase and t...
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ژورنال
عنوان ژورنال: Acta Crystallographica Section A Foundations of Crystallography
سال: 2000
ISSN: 0108-7673
DOI: 10.1107/s0108767300023266